X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California

Publication/Creation:: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1986
Format:: Book

More Details

Additional/Related Title Information

Full Title:: X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California / Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester [and others].
Series Titles:: Proceedings of SPIE--the International Society for Optical Engineering ; v. 690
Proceedings of SPIE--the International Society for Optical Engineering ; v. 690.

Related Names

Additional Author/Creators:: Rusch, Thomas William
University of Rochester. Institute of Optics
Society of Photo-optical Instrumentation Engineers

Subjects/Genre

Genre:: Conference papers and proceedings
Electronic books
Subjects:: Nondestructive testing--Congresses
X-ray spectroscopy--Congresses
Materials--Testing--Congresses

Description/Summary

Bibliography:: Includes bibliographical references and index.
Language:: English
Language Note:: English.
Physical Type/Description:: 1 online resource (vi, 156 pages) : illustrations
General Note:: Issued as part of the SPIE digital library.
Local Note:: Available to current Emory faculty, students and staff.

Additional Identifiers

Catalog ID (MMSID):: 9936955859702486
ISSN:: 1996-756X
OCLC Number:: 563086823